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Project Tree

  • Accelerated Testing
    • Outdoor Accelerated Testing of PV Modules
    • Hi-Throughput Optical Mapping
    • C-AST: Combined Accelerated Stress Testing
    • Screen Printed Cu
    • Encapsulant Degradation Mechanisms and Sequenced Accelerated Testing
    • Deconvoluting Simultaneous UV Degradations
    • Emerging module interconnect technologies
    • UVID-Recovery
  • Adhesion and Adhesives
    • Conductive Polymer Adhesive Composites
    • Reliability of HE Cells with Cu Contacts
    • IBC Modules
  • B and B Data
  • Central Data Resource - Data Analysis
    • PV Degradation Analytics
    • PV Degradation Prediction Tool and Database
    • Data Aggregated from Literature Searches
    • Photovoltaic Climate Zones
    • Mapping PV degradation by LLM
  • Coatings
    • H-H, Anti-Reflective, and Anti-Soiling Coatings
    • Coatings to Reduce Soiling and PID Losses
    • PV Anti-Reflection Coating Performance
    • Laser Patterned Multifunctional Glass
  • DuraMAT User Resources
  • DECS (DuraMAT Early Career Scientists)
  • Encapsulants and Barriers
    • Reliable Low-Cost Encapsulation and Barrier Tech
    • Scalable RTR Packaging Materials
    • Flexible, Long Life Front Sheet
    • New Materials for PV encapsulation
    • BACKFLIP
    • Laser welded Edge Seals
    • EPE
    • Modeling Crystal and Melt in EVA and Polyolefin
  • Mechanics and Cracking
    • Imaging Stress in c-Si
    • Low-Cost Screen Printing Metallization
    • Effect of Cell Cracks on Module Power Loss and Degradation
    • Cell Crack Characterization using Digital Image Correlation
    • UV Fluorescence Images and Models
    • PV Crack Stress and Power Loss
    • WhatsCracking
    • Large Module Glass Resilience
    • Predicting glass breakage by hail impact
    • Strengthen Thin-Glass
  • Modeling
    • 50-Year PV Modeling
    • SIERRA-COMSOL converter
    • Simulating PV wind loading
  • Module Forensics
    • Identifying Degradation Mechanisms using Imaging
    • Backside Defect Imaging in Si PV
    • Module-level Solutions for Cell-front Damage
    • GG PV with Emerging Encapsulants and Half-Cut Cells
    • PLatypus
    • BS Depth Profile
    • PV Module BOM and Test Data
    • Hail Forensics Database
    • Module Materials Library
  • Module Material Solutions
    • PV Recycling
  • Predictive Simulation
    • Thermomechanical cell demonstration
    • Analyzing Hail Impacts on PV Modules Using Computational Simulation
    • Backside UV Degradation Modelling
    • Encapsulant Degradation Mechanisms
    • Tensor Decomposition for Stress Testing
  • PV Field Data
    • Enphase Micro-Inverter
    • NREL Soiling Map
    • Albedo Data for Bifacial PV Systems
    • PVCAMPER
    • PV Pro
    • PV Lifetime
    • Regional Test Centers
    • Example and Evaluation Data
    • NREL Bifacial Experimental Single-Axis Tracking (BEST) field
    • BEST Field Degradation Research
    • PVPMC
    • Cell Cracking and Power Loss in Modern Modules
    • Non-contact inspection of PV system fasteners
    • Cracks and n-type field aging
    • Leveling-up for Large-format Modules
  • PV Fleet Data Initiative
    • Data Access for PV Fleets Intial Meetings
  • Techno-Economic Analysis
    • Solar Levelized Cost of Energy Analysis
  • Test 1
    • Test 2

Projects


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techno-economic-analysis

Techno-Economic Analysis

Economic and technological analysis of PV deployment

Sub-projects:
Solar Levelized Cost of Energy Analysis
emn logo
National Renewable Energy Laboratory
Sandia National Laboratory logo
Lawrence Berkeley National Laboratory
National Acceleration Laboratory

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