Effect of Cell Cracks on Module Power Loss and Degradation - データセット
| Project ID | a0f54716-00a0-4a51-bfed-711c3308b90f | 
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predicts2
5 ResourcesThis data set contains EL images for 36 modules they went through QualPlus and IEC 61215 standard aging tests. The raw module images, perspective transformed module images and...