1. ទំព័រដើម
  2. បណ្តុំទិន្នន័យ


Measurement Types: JV-IV
Institution: SNL

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  • Cell Crack XRT

    5 Resources
    Processed XRT data and corresponding EL and IV measurements for pristine and indented (cracked) cells in mini-modules. Experiments and analysis conducted by Ian Slauch at...
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