New Cells, New Issues: Stress Tests For N-Type PV Module Designs

DuraMAT 2.0

Disruptive Acceleration Science

Category: Accelerated Testing

Recipient Kiwa PVEL (PI: Karin, Todd)

Subs NREL

Status Awarded

Abstract Modern n-type PV technologies have shown notable power degradation in specific bills of materials (BOMs) under accelerated ultraviolet light-induced degradation (UVID) testing and potential induced degradation (PID). This project aims to focus on investigating these two degradation modes and to determine state-of-the art reliability of industrial-size, n-type modules with a variety of constructions (e.g. Glass/Glass vs. Glass/Backsheet laminate, n-type vs. p-type cells, different encapsulants). Pre/post-stress characterization data is collected (including flash, Electroluminescence (EL), Ultra-Violet Fluorescence (UVF) and/or spectral responsivity), collated with BOM data, anonymized and published. Another important aspect will be the development of UVID recovery methods to determine if UVID is permanent or recoverable. The UVID testing results will be compared to results of other stress tests (DH2000, standalone PID, field exposure, and other Kiwa PVEL’s PQP tests). Root-cause analysis will be performed on selected samples using Coring, Scanning Electron Microscopy (SEM)/ Energy Dispersive X-ray Spectroscopy (EDS, adhesion, Thermogravimetric Analysis (TGA), and/or Fourier Transform Infrared Spectroscopy (FTIR).