Imaging Stress in c-Si

Direct Imaging Stress in Crystalline Silicon Modules

Recipient Arizona State University(PI: Bertoni, Mariana)

Subs NREL SNL

Status Awarded

Abstract Fundamental Characterization of Cell Cracking through laboratory based X-ray Topography, as a non-destructive and reliable way to monitor the generation and evolution of solar cell cracking, deflection and stress as a function of processing and external stressors (loads and aging).