imaging-stress-in-c-si

Direct Imaging Stress in Crystalline Silicon Modules

Recipient Arizona State University(PI: Bertoni, Mariana)

Subs NREL SNL

Status Awarded

Abstract Fundamental Characterization of Cell Cracking through laboratory based X-ray Topography, as a non-destructive and reliable way to monitor the generation and evolution of solar cell cracking, deflection and stress as a function of processing and external stressors (loads and aging).

Created On November 1, 2017, 21:22 (UTC)

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