Direct Imaging Stress in Crystalline Silicon Modules
Recipient Arizona State University(PI: Bertoni, Mariana)
Subs NREL SNL
Abstract Fundamental Characterization of Cell Cracking through laboratory based X-ray Topography, as a non-destructive and reliable way to monitor the generation and evolution of solar cell cracking, deflection and stress as a function of processing and external stressors (loads and aging).
Created On November 1, 2017, 21:22 (UTC)
Datasets 0 Datasets