Imaging Stress in c-Si
Direct Imaging Stress in Crystalline Silicon Modules
Recipient Arizona State University(PI: Bertoni, Mariana)
Subs NREL SNL
Abstract Fundamental Characterization of Cell Cracking through laboratory based X-ray Topography, as a non-destructive and reliable way to monitor the generation and evolution of solar cell cracking, deflection and stress as a function of processing and external stressors (loads and aging).